Fashion Scout has announced that the eponymous New York label Han Wen is the SS17 winner of its Merit Award. Selected from hundreds of applicants, Han’s attention to detail and combination of gold hardware, soft shell pink pleats and complex leather work turned the heads of this season’s selection panel. He follows in the footsteps of past winners including David Koma, Eudon Choi, Phoebe English, Roberts|Wood and Xiao Li.

A graduate of Parsons, Han Wen was a finalist in the Kering x Parsons’ Empowering Imagination competition and was featured as part of a Vogue US online series on the finalist. Han’s thesis collection An Escape from Tradition juxtaposes traditional Chinese armour with modern techniques and fabrics.

In winning this season’s Merit Award Han Wen will receive a fully sponsored catwalk show during London Fashion Week as well as exhibiting in the Fashion Scout London Exhibition where he will be introduced to press and buyers. Han Wen will showcase his collection at 17.30 on 17 September at Fashion Scout during London Fashion Week.

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Han Wen in 'fashion & accessories'
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